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JSS
2008
89views more  JSS 2008»
15 years 6 months ago
A search-based framework for automatic testing of MATLAB/Simulink models
Search-based test-data generation has proved successful for code-level testing but almost no search-based work has been carried out at evels of abstraction. In this paper the appl...
Yuan Zhan, John A. Clark
ICCD
2004
IEEE
122views Hardware» more  ICCD 2004»
16 years 3 months ago
Quality Improvement Methods for System-Level Stimuli Generation
Functional verification of systems is aimed at validating the integration of previously verified components. It deals with complex designs, and invariably suffers from scarce re...
Roy Emek, Itai Jaeger, Yoav Katz, Yehuda Naveh
DSD
2007
IEEE
140views Hardware» more  DSD 2007»
16 years 25 days ago
Pseudo-Random Pattern Generator Design for Column-Matching BIST
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...
Petr Fiser
TSE
2002
115views more  TSE 2002»
15 years 6 months ago
Simplifying and Isolating Failure-Inducing Input
Given some test case, a program fails. Which circumstances of the test case are responsible for the particular failure? The Delta Debugging algorithm generalizes and simplifies som...
Andreas Zeller, Ralf Hildebrandt
ASPDAC
2007
ACM
108views Hardware» more  ASPDAC 2007»
15 years 10 months ago
Warning: Launch off Shift Tests for Delay Faults May Contribute to Test Escapes
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
Zhuo Zhang, Sudhakar M. Reddy, Irith Pomeranz