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ICCD
2002
IEEE
108views Hardware» more  ICCD 2002»
16 years 3 months ago
Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic...
CEC
2007
IEEE
16 years 25 days ago
Estimation of distribution algorithms for testing object oriented software
— One of the main tasks software testing involves is the generation of the test cases to be used during the test. Due to its expensive cost, the automation of this task has becom...
Ramón Sagarna, Andrea Arcuri, Xin Yao
UML
2004
Springer
15 years 11 months ago
The AGEDIS Tools for Model Based Testing
We describe the tools and interfaces created by the AGEDIS project, a European Commission sponsored project for the creation of a methodology and tools for automated model driven ...
Alan Hartman, Kenneth Nagin
VTS
1997
IEEE
133views Hardware» more  VTS 1997»
15 years 10 months ago
ATPG for scan chain latches and flip-flops
A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking ex...
Samy Makar, Edward J. McCluskey
COMPLEX
2009
Springer
15 years 10 months ago
Non-sufficient Memories That Are Sufficient for Prediction
The causal states of computational mechanics define the minimal sufficient (prescient) memory for a given stationary stochastic process. They induce the -machine which is a hidden...
Wolfgang Löhr, Nihat Ay