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    VLSID
    1995
    IEEE
    112views VLSI» more  VLSID 1995»
    An efficient automatic test generation system for path delay faults in combinational circuits
    15 years 10 months ago
    An efficient automatic test generation system for path delay faults in combinational circuits
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    Ananta K. Majhi, James Jacob, Lalit M. Patnaik, Vi...
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    VLSID
    1995
    IEEE
    107views VLSI» more  VLSID 1995»
    Functional test generation for non-scan sequential circuits
    15 years 10 months ago
    Functional test generation for non-scan sequential circuits
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    Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...
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    DAC
    1991
    ACM
    95views Computer Architecture» more  DAC 1991»
    A Transitive Closure Based Algorithm for Test Generation
    15 years 10 months ago
    A Transitive Closure Based Algorithm for Test Generation
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    Srimat T. Chakradhar, Vishwani D. Agrawal
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    ICTAI
    1994
    IEEE
    119views Artificial Intelligence» more  ICTAI 1994»
    GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
    15 years 10 months ago
    GATTO: An Intelligent Tool for Automatic Test Pattern Generation for Digital Circuits
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    Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
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    ITC
    1994
    IEEE
    136views Hardware» more  ITC 1994»
    An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
    15 years 10 months ago
    An Automatic Test Pattern Generator for Large Sequential Circuits Based on Genetic Algorithms
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    Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza ...
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