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142

ISSRE
2008
IEEE

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RUGRAT: Runtime Test Case Generation Using Dynamic Compilers

16 years 24 days ago

RUGRAT: Runtime Test Case Generation Using Dynamic Compilers

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Ben Breech, Lori L. Pollock, John Cavazos

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118

KBSE
2008
IEEE

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Heuristics for Scalable Dynamic Test Generation

16 years 23 days ago

Heuristics for Scalable Dynamic Test Generation

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Jacob Burnim, Koushik Sen

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139

FMICS
2007
Springer

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Automatic Interoperability Test Case Generation Based on Formal Definitions

16 years 16 days ago

Automatic Interoperability Test Case Generation Based on Formal Definitions

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Alexandra Desmoulin, César Viho

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126

TAP
2007
Springer

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Using Contracts and Boolean Queries to Improve the Quality of Automatic Test Generation

16 years 15 days ago

Using Contracts and Boolean Queries to Improve the Quality of Automatic Test Generation

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Lisa (Ling) Liu, Bertrand Meyer, Bernd Schoeller

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168

DEPCOS
2006
IEEE

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Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

16 years 13 days ago

Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers

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Zoltán Micskei, István Majzik

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