We present a new methodology which takes into consideration the effect of Within-Die (WID) process variations on a low-voltage parallel system. We show that in the presence of pro...
Navid Azizi, Muhammad M. Khellah, Vivek De, Farid ...
: Due to exponential increase in subthreshold leakage with technology scaling and temperature increase, leakage power is becoming a major fraction of total power in the active mode...
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
We propose a multiple source domain adaptation method, referred to as Domain Adaptation Machine (DAM), to learn a robust decision function (referred to as target classifier) for l...
In this paper we investigate two aspects of ranking problems on large graphs. First, we augment the deterministic pruning algorithm in Sarkar and Moore (2007) with sampling techni...