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168
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...
182
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DAC
2008
ACM
16 years 7 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
160
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DAC
2007
ACM
16 years 7 months ago
2007
ACM
The ability to account for the growing impacts of multiple process variations in modern technologies is becoming an integral part of nanometer VLSI design. Under the context of ti...
169
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DAC
2001
ACM
16 years 7 months ago
2001
ACM
Milenko Drinic UCLA Computer Science Dep. 4732 Boelter Hall Los Angeles, CA 90095-1596 milenko@cs.ucla.edu Darko Kirovski Microsoft Research One Microsoft Way Redmond, WA 98052 da...
171
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DAC
2004
ACM
16 years 7 months ago
2004
ACM
Long design cycles due to the inability to predict silicon realities is a well-known problem that plagues analog/RF integrated circuit product development. As this problem worsens...