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ASPDAC
2007
ACM
144views Hardware» more  ASPDAC 2007»
15 years 10 months ago
Parameter Reduction for Variability Analysis by Slice Inverse Regression (SIR) Method
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
Alexander V. Mitev, Michael Marefat, Dongsheng Ma,...
ASPDAC
2007
ACM
86views Hardware» more  ASPDAC 2007»
15 years 10 months ago
Fast Buffered Delay Estimation Considering Process Variations
- Advanced process technologies impose more significant challenges especially when manufactured circuits exhibit substantial process variations. Consideration of process variations...
Tien-Ting Fang, Ting-Chi Wang
C3S2E
2009
ACM
15 years 10 months ago
The promise of solid state disks: increasing efficiency and reducing cost of DBMS processing
Most database systems (DBMSs) today are operating on servers equipped with magnetic disks. In our contribution, we want to motivate the use of two emerging and striking technologi...
Karsten Schmidt 0002, Yi Ou, Theo Härder
CHIMIT
2007
ACM
15 years 10 months ago
Looking for trouble: understanding end-user security management
End users are often cast as the weak link in computer security; they fall victim to social engineering and tend to know very little about security technology and policies. This pa...
Joshua B. Gross, Mary Beth Rosson
CIBCB
2007
IEEE
15 years 10 months ago
Associative Artificial Neural Network for Discovery of Highly Correlated Gene Groups Based on Gene Ontology and Gene Expression
Abstract-- The advance of high-throughput experimental technologies poses continuous challenges to computational data analysis in functional and comparative genomics studies. Gene ...
Ji He, Xinbin Dai, Xuechun Zhao