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153
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DATE
2006
IEEE
16 years 19 days ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
144
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DATE
2006
IEEE
16 years 19 days ago
2006
IEEE
Automakers are still facing an increasing complexity in vehicle requirements with regard to their EE systems. This complexity is not only caused by innovations, which are being pr...
163
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EDOC
2006
IEEE
16 years 19 days ago
2006
IEEE
— An enterprise architecture is intended to be a comprehensive blueprint describing the key components and relationships for an enterprise from strategies to business processes t...
159
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ETFA
2006
IEEE
16 years 19 days ago
2006
IEEE
In the context of distributed real-time systems as deployed in the avionic and the automotive domain a substantial number of system malfunctions result from connector faults. For ...
163
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HICSS
2006
IEEE
16 years 19 days ago
2006
IEEE
Little research has examined the relevance of real options for valuation of information technology (IT) investments for prioritizing a portfolio of projects. When the effect of pr...