Suppression of leakage current and reduction in device-todevice variability will be key challenges for sub-45nm CMOS technologies. Non-classical transistor structures such as the ...
Technology is advancing at a rapid pace, automating many everyday chores in the process, changing the way we perform work and providing various forms of entertainment. Makers of t...
Due to the problem of information overload, locating relevant Web portals precisely based on user requirements is quite an essential task. As the need for application-to-applicatio...
In the future, intelligent sensors will connected through networks, each node have its own autonomy, heterogeneity, and under dynamic environments. We call these systems as a Hete...
A difficult challenge in the industrialisation of Model-Driven Development is managing different versions of models. Different versions may arise at any time during the development...
Klaus-D. Engel, Richard F. Paige, Dimitrios S. Kol...