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IOLTS
2003
IEEE
124views Hardware» more  IOLTS 2003»
16 years 1 days ago
The positive effect on IC yield of embedded Fault Tolerance for SEUs
Fault tolerant design is a technique emerging in Integrated Circuits (IC’s) to deal with the increasing error susceptibility (Soft Errors, or Single Event Upsets, SEU) caused by...
André K. Nieuwland, Richard P. Kleihorst
CODES
2006
IEEE
16 years 25 days ago
A run-time, feedback-based energy estimation model For embedded devices
We present an adaptive, feedback-based, energy estimation model for battery-powered embedded devices such as sensor network gateways and hand-held computers. Our technique maps ha...
Selim Gurun, Chandra Krintz
SIGSOFT
2003
ACM
16 years 7 months ago
Regression testing of GUIs
Although graphical user interfaces (GUIs) constitute a large part of the software being developed today and are typically created using rapid prototyping, there are no effective r...
Atif M. Memon, Mary Lou Soffa
ISSTA
2004
ACM
16 years 6 days ago
Testing malware detectors
In today’s interconnected world, malware, such as worms and viruses, can cause havoc. A malware detector (commonly known as virus scanner) attempts to identify malware. In spite...
Mihai Christodorescu, Somesh Jha
ESEC
1999
Springer
15 years 11 months ago
Synergy between Component-Based and Generative Approaches
Building software systems out of pre-fabricated components is a very attractive vision. Distributed Component Platforms (DCP) and their visual development environments bring this v...
Stan Jarzabek, Peter Knauber