4276 search results - page 669 / 856 » Techniques for Empirical Validation |
156
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CSMR
2006
IEEE
16 years 13 days ago
2006
IEEE
This paper describes our experiences of applying dynamic analysis solutions on an industrial legacy application written in C, with the help of Aspect Orientation (AO). We use a nu...
174
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DSN
2006
IEEE
16 years 13 days ago
2006
IEEE
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects. In particular, single event upsets, such as soft errors, and hard faults are ...
192
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EUROMICRO
2006
IEEE
16 years 13 days ago
2006
IEEE
This paper presents the modeling paradigm for Integrated Modular Avionics Design MIMAD V0, which is an extensible component-oriented framework that enables high level models of sy...
163
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GLVLSI
2006
IEEE
16 years 13 days ago
2006
IEEE
Process variations have become a serious concern for nanometer technologies. The interconnect and device variations include interand intra-die variations of geometries, as well as...
134
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ICMCS
2006
IEEE
16 years 13 days ago
2006
IEEE
Blocking artifact is the most prevailing degradation caused by block-based DCT coding techniques under low bit-rate conditions. To alleviate blockings perceptually, it is desirabl...