4276 search results - page 139 / 856 » Techniques for Empirical Validation |
129
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DAC
2002
ACM
16 years 7 months ago
2002
ACM
As designers become more aggressive in introducing optical components to micro-systems, rigorous optical models are required for system-level simulation tools. Common optical mode...
139
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DATE
2000
IEEE
15 years 11 months ago
2000
IEEE
: IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly ...
143
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VLSID
2007
IEEE
16 years 6 months ago
2007
IEEE
With scaling of CMOS technologies, sub-threshold, gate and reverse biased junction band-to-band-tunneling leakage have increased dramatically. Together they account for more than 2...
141
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ICCAD
2004
IEEE
16 years 3 months ago
2004
IEEE
We address the classic wire-length estimation problem and propose a new statistical wire-length estimation approach that captures the probability distribution function of net leng...
184
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ICAPR
2009
Springer
16 years 1 months ago
2009
Springer
This paper proposes an efficient skin-color and template based technique for automatic ear detection in a side face image. The technique first separates skin regions from nonski...