1472 search results - page 218 / 295 » Technique Integration for Requirements Assessment |
139
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DAC
2006
ACM
16 years 7 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
158
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KBSE
2007
IEEE
16 years 18 days ago
2007
IEEE
Completing software maintenance and evolution tasks for today’s large, complex software systems can be difficult, often requiring considerable time to understand the system well...
163
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ISLPED
2006
ACM
16 years 9 days ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
217
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STORYTELLING
2005
Springer
15 years 11 months ago
2005
Springer
The goal of this research is to lay the foundations for a formal theory , that abstracts from the procedural and interactive aspects involved in the generation of dramatic content....
167
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RSP
1999
IEEE
15 years 10 months ago
1999
IEEE
Over the past decade, the steady growth rate of FPGA device capacities has enabled the development of multi-FPGA prototyping environments capable of implementing millions of logic...