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KBSE
2006
IEEE
16 years 20 days ago
Reverse Engineering of Design Patterns from Java Source Code
Recovering design patterns can enhance existing source code analysis tools by bringing program understanding to the design level. This paper presents a new, fully automated patter...
Nija Shi, Ronald A. Olsson
DAC
2006
ACM
16 years 7 months ago
Generation of yield-aware Pareto surfaces for hierarchical circuit design space exploration
Pareto surfaces in the performance space determine the range of feasible performance values for a circuit topology in a given technology. We present a non-dominated sorting based ...
Saurabh K. Tiwary, Pragati K. Tiwary, Rob A. Ruten...
JSW
2008
99views more  JSW 2008»
15 years 6 months ago
Using Data Mining in MURA Graphic Problems
The MURA phenomenon will result lots of problems in Photomask and TFT-LCD industries as well. In this paper, we designed and developed a MURA related association rules which suitab...
Wen-Hsing Kao, Jason C. Hung, Victoria Hsu
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
16 years 1 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita
ISCAS
2006
IEEE
135views Hardware» more  ISCAS 2006»
16 years 20 days ago
A sensor system on chip for wireless microsystems
Recent years have seen the rapid development of microsensor technology, system on chip design, wireless technology and ubiquitous computing. When assembled into a complex microsys...
L. Wang, Nizamettin Aydin, A. Astaras, M. Ahmadian...