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KBSE
2008
IEEE
16 years 1 months ago
Random Test Run Length and Effectiveness
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
James H. Andrews, Alex Groce, Melissa Weston, Ru-G...
VTS
1996
IEEE
112views Hardware» more  VTS 1996»
15 years 10 months ago
Optimal voltage testing for physically-based faults
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Yuyun Liao, D. M. H. Walker
ICWS
2010
IEEE
15 years 8 months ago
WebMov: A Dedicated Framework for the Modelling and Testing of Web Services Composition
This paper presents a methodology and a set of tools for the modelling, validation and testing of Web service composition, conceived and developed within the French national projec...
Ana R. Cavalli, Tien-Dung Cao, Wissam Mallouli, El...
IR
2002
15 years 6 months ago
Hierarchical Text Categorization Using Neural Networks
This paper presents the design and evaluation of a text categorization method based on the Hierarchical Mixture of Experts model. This model uses a divide and conquer principle to ...
Miguel E. Ruiz, Padmini Srinivasan
ICCD
2004
IEEE
109views Hardware» more  ICCD 2004»
16 years 3 months ago
Low Power Test Data Compression Based on LFSR Reseeding
Many test data compression schemes are based on LFSR reseeding. A drawback of these schemes is that the unspecified bits are filled with random values resulting in a large number ...
Jinkyu Lee, Nur A. Touba