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VLSID
1997
IEEE
135views VLSI» more  VLSID 1997»
15 years 10 months ago
Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
Dilip Krishnaswamy, Michael S. Hsiao, Vikram Saxen...
JOT
2007
123views more  JOT 2007»
15 years 6 months ago
Towards a Tool Supporting Integration Testing of Aspect-Oriented Programs
Aspect-Oriented Programming is an emerging software engineering paradigm. It offers new constructs and tools improving separation of crosscutting concerns into single units called...
Philippe Massicotte, Linda Badri, Mourad Badri
TSE
2010
161views more  TSE 2010»
15 years 4 months ago
Finding Bugs in Web Applications Using Dynamic Test Generation and Explicit-State Model Checking
— Web script crashes and malformed dynamically-generated web pages are common errors, and they seriously impact the usability of web applications. Current tools for web-page vali...
Shay Artzi, Adam Kiezun, Julian Dolby, Frank Tip, ...
BMCBI
2008
122views more  BMCBI 2008»
15 years 6 months ago
Effects of dependence in high-dimensional multiple testing problems
Background: We consider effects of dependence among variables of high-dimensional data in multiple hypothesis testing problems, in particular the False Discovery Rate (FDR) contro...
Kyung In Kim, Mark A. van de Wiel
DAC
2009
ACM
16 years 7 months ago
Generating test programs to cover pipeline interactions
Functional validation of a processor design through execution of a suite of test programs is common industrial practice. In this paper, we develop a high-level architectural speci...
Thanh Nga Dang, Abhik Roychoudhury, Tulika Mitra, ...