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TCAD
2002
106views more  TCAD 2002»
15 years 6 months ago
Design of hierarchical cellular automata for on-chip test pattern generator
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...
Biplab K. Sikdar, Niloy Ganguly, Parimal Pal Chaud...
AAECC
2002
Springer
132views Algorithms» more  AAECC 2002»
15 years 6 months ago
Lattice Structure and Linear Complexity of Nonlinear Pseudorandom Numbers
It is shown that a q-periodic sequence over the finite field Fq passes an extended version of Marsaglia's lattice test for high dimensions if and only if its linear complexity...
Harald Niederreiter, Arne Winterhof
ENTCS
2008
88views more  ENTCS 2008»
15 years 6 months ago
Specification of Conditions for Error Diagnostics
This paper describes the basic concepts of error diagnostics and an associated rule system whose application helps to identify potential hardware/software locations of errors whic...
Christof Efkemann, Tobias Hartmann
VLSID
2002
IEEE
131views VLSI» more  VLSID 2002»
16 years 6 months ago
Divide-and-Conquer IDDQ Testing for Core-Based System Chips
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
C. P. Ravikumar, Rahul Kumar
ATS
1996
IEEE
117views Hardware» more  ATS 1996»
15 years 10 months ago
Hierarchical Test Generation with Built-In Fault Diagnosis
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
Dirk Stroobandt, Jan Van Campenhout