1237 search results - page 86 / 248 » Strictness and Totality Analysis |
159
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PRDC
1999
IEEE
15 years 10 months ago
1999
IEEE
This paper presents a measurement-based dependability study of a Networked Windows NT system based on field data collected from NT System Logs from 503 servers running in a produc...
168
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EURODAC
1994
IEEE
15 years 10 months ago
1994
IEEE
of a direct implementation of this criterion. This paper presents the first critical path finding tool based on the exact criterion. It offers therefore better results in compariso...
168
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WSC
2007
15 years 8 months ago
2007
Photolithography is generally regarded as the most constraining element in semiconductor manufacturing. This is primarily attributable to the high capital investment and extensive...
169
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NIPS
2004
15 years 7 months ago
2004
The NIPS 2003 workshops included a feature selection competition organized by the authors. We provided participants with five datasets from different application domains and calle...
192
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JSW
2008
15 years 6 months ago
2008
The current software development environment has been changing into new development paradigms such as concurrent distributed development environment and the so-called open source p...