2286 search results - page 216 / 458 » Statistical timing analysis based on a timing yield model |
170
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BMCBI
2010
15 years 6 months ago
2010
Background: Many high-throughput genomic experiments, such as Synthetic Genetic Array and yeast two-hybrid, use colony growth on solid media as a screen metric. These experiments ...
170
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ISCAS
2003
IEEE
15 years 11 months ago
2003
IEEE
We propose an algorithm based on singular value decomposition (SVD) to reduce the number of process variation variables. With few process variation variables, fault simulation and...
184
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Most existing RCL−1 circuit reductions stamp inverse inductance L−1 elements by a second-order nodal analysis (NA). The NA formulation uses nodal voltage variables and describ...
205
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HASE
1998
IEEE
15 years 10 months ago
1998
IEEE
Fault trees provide a graphical and logical framework for analyzing the reliability of systems. A fault tree provides a conceptually simple modeling framework to represent the sys...
177
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BMCBI
2007
15 years 6 months ago
2007
Background: Boolean network (BN) modeling is a commonly used method for constructing gene regulatory networks from time series microarray data. However, its major drawback is that...