— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
Jinjun Xiong, Vladimir Zolotov, Chandu Visweswaria...
We revisit a basic element of modern signal integrity analysis, the modeling of worst-case coupling capacitance effects within a switch factor (SF) based methodology. We show that...
—Architecture-based software reliability analysis methods shall help software architects to identify critical software components and to quantify their influence on the system r...
We present a compiler optimization approach that uses the simulated evolution (SE) paradigm to enhance the finish time of heuristically scheduled computations with communication t...
Background: Cluster analysis is an integral part of high dimensional data analysis. In the context of large scale gene expression data, a filtered set of genes are grouped togethe...