6366 search results - page 887 / 1274 » Statistical Performance Modeling and Optimization |
194
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EDBT
2006
ACM
15 years 10 months ago
2006
ACM
As data management applications grow more complex, they may need efficient distributed query processing, but also subscription management, data archival etc. To enact such applicat...
146
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EVOW
2008
Springer
15 years 8 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
180
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NIPS
2004
15 years 8 months ago
2004
We present a competitive analysis of Bayesian learning algorithms in the online learning setting and show that many simple Bayesian algorithms (such as Gaussian linear regression ...
188
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WSC
2001
15 years 8 months ago
2001
Discrete-event simulation is a common tool for the analysis of semiconductor manufacturing systems. With the aid of a simulation model, and in conjunction with sensitivity analysi...
136
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WSC
2004
15 years 8 months ago
2004
The process by which outpatients are scheduled for a doctor's visit is a crucial determinant of the overall efficiency of the patient flow. The problem at hand consists of de...