4077 search results - page 641 / 816 » Statistical Approach to Networks-on-Chip |
142
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
– Identifying worst-case voltage drop conditions in every module supplied by the power grid is a crucial problem in modern IC design. In this paper we develop a novel methodology...
151
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
176
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ICCAD
2006
IEEE
16 years 3 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
139
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CVPR
2010
IEEE
16 years 2 months ago
2010
IEEE
Repetitive and ambiguous visual structures in general pose a severe problem in many computer vision applications. Identification of incorrect geometric relations between images s...
179
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CVPR
2010
IEEE
16 years 2 months ago
2010
IEEE
Based on multifractal analysis in wavelet pyramids of texture images, a new texture descriptor is proposed in this paper that implicitly combines information from both spatial and...