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DAC
2008
ACM
16 years 7 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao
FC
2009
Springer
150views Cryptology» more  FC 2009»
16 years 1 months ago
Privacy-Preserving Information Markets for Computing Statistical Data
Abstract. Consider an “information market” where private and potentially sensitive data are collected, treated as commodity and processed into aggregated information with comme...
Aggelos Kiayias, Bülent Yener, Moti Yung
ICDM
2007
IEEE
166views Data Mining» more  ICDM 2007»
16 years 24 days ago
Mining Statistical Information of Frequent Fault-Tolerant Patterns in Transactional Databases
Constraints applied on classic frequent patterns are too strict and may cause interesting patterns to be missed. Hence, researchers have proposed to mine a more relaxed version of...
Ardian Kristanto Poernomo, Vivekanand Gopalkrishna...
OOPSLA
2007
Springer
16 years 18 days ago
Statistically rigorous java performance evaluation
Java performance is far from being trivial to benchmark because it is affected by various factors such as the Java application, its input, the virtual machine, the garbage collect...
Andy Georges, Dries Buytaert, Lieven Eeckhout
CIKM
2003
Springer
15 years 11 months ago
Statistical transliteration for english-arabic cross language information retrieval
Out of vocabulary (OOV) words are problematic for cross language information retrieval. One way to deal with OOV words when the two languages have different alphabets, is to trans...
Nasreen Abdul Jaleel, Leah S. Larkey