918 search results - page 100 / 184 » Speculative Issue Logic |
143
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VLSID
2008
IEEE
16 years 6 months ago
2008
IEEE
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
154
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ICCD
2006
IEEE
16 years 3 months ago
2006
IEEE
This paper presents a new scheduling technique to improve the speed, power, and scalability of a dynamic scheduler. In a high-performance superscalar processor, the instruction sc...
157
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ICCAD
2008
IEEE
16 years 3 months ago
2008
IEEE
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
166
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DDECS
2007
IEEE
16 years 16 days ago
2007
IEEE
— To increase the amount of logic available in SRAM-based FPGAs manufacturers are using nanometric technologies to boost logic density and reduce prices. However, nanometric scal...
141
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FOSSACS
2007
Springer
16 years 10 days ago
2007
Springer
ATL is a temporal logic geared towards the specification and verification of properties in multi-agents systems. It allows to reason on the existence of strategies for coalitions...