Real-world data is known to be imperfect, suffering from various forms of defects such as sensor variability, estimation errors, uncertainty, human errors in data entry, and gaps ...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
As System on a Chip (SoC) testing faces new challenges, some new test architectures must be developed. This paper describes a Test Access Mechanism (TAM) named CASBUS that solves ...
Most software engineering techniques that deal with software products customization are based on anticipation: The software designer has to foresee, somehow, the future needs for ...
Abstract. This paper considers the Steiner tree problem in the model of twostage stochastic optimization with recourse. This model, the focus of much recent research [1–4], tries...