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ITC
2000
IEEE
93views Hardware» more  ITC 2000»
15 years 11 months ago
Stuck-fault tests vs. actual defects
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
Edward J. McCluskey, Chao-Wen Tseng
WETICE
2000
IEEE
15 years 11 months ago
The Mechanics of Collaboration: Developing Low Cost Usability Evaluation Methods for Shared Workspaces
We introduce a conceptual framework that articulates the mechanics of collaboration for shared-workspace groupware: the low level actions and interactions that must be carried out...
Carl Gutwin, Saul Greenberg
EUROMICRO
1999
IEEE
15 years 11 months ago
Error Recovery using Forced Validity Assisted by Executable Assertions for Error Detection: An Experimental Evaluation
This paper proposes and evaluates error detection and recovery mechanisms suitable for embedded systems. The purpose of these mechanisms is to provide detection of and recovery fr...
Martin Hiller
CGI
1998
IEEE
15 years 11 months ago
An Object-Oriented Approach to Model Scenes of Buildings
This paper presents an object-oriented approach for describing and modelling buildings by means of computer graphics. The approach is based on an object- and component-oriented gr...
Thierry Matthey, Hanspeter Bieri
ICIAP
1999
ACM
15 years 11 months ago
Methods for Dynamic Classifier Selection
In the field of pattern recognition, the concept of Multiple Classifier Systems (MCSs) was proposed as a method for the development of high performance classification systems. At ...
Giorgio Giacinto, Fabio Roli