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DAC
2008
ACM
16 years 7 months ago
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...
Juan Antonio Maestro, Pedro Reviriego
KDD
2007
ACM
154views Data Mining» more  KDD 2007»
16 years 6 months ago
An event-based framework for characterizing the evolutionary behavior of interaction graphs
Interaction graphs are ubiquitous in many fields such as bioinformatics, sociology and physical sciences. There have been many studies in the literature targeted at studying and m...
Sitaram Asur, Srinivasan Parthasarathy, Duygu Ucar
CHI
2002
ACM
16 years 6 months ago
Creating principal 3D curves with digital tape drawing
Previous systems have explored the challenges of designing an interface for automotive styling which combine the metaphor of 2D drawing using physical tape with the simultaneous c...
Tovi Grossman, Ravin Balakrishnan, Gordon Kurtenba...
SIGMOD
2005
ACM
141views Database» more  SIGMOD 2005»
16 years 6 months ago
Integrating databases and workflow systems
There has been an information explosion in fields of science such as high energy physics, astronomy, environmental sciences and biology. There is a critical need for automated sys...
Srinath Shankar, Ameet Kini, David J. DeWitt, Jeff...
PERCOM
2005
ACM
16 years 6 months ago
Understanding the real behavior of Mote and 802.11 ad hoc networks: an experimental approach
IEEE 802.11 and Mote devices are today two of the most interesting wireless technologies for ad hoc and sensor networks respectively, and many efforts are currently devoted to und...
Giuseppe Anastasi, Eleonora Borgia, Marco Conti, E...