Unit testing component-based distributed systems traditionally involved testing functional concerns of the application logic throughout the development lifecycle. In contrast, tes...
James H. Hill, Hamilton A. Turner, James R. Edmond...
The evolution of microprocessors has been hindered by their increasing power consumption and the heat generation speed on-die. High temperature impairs the processor’s reliabili...
Jun Yang 0002, Xiuyi Zhou, Marek Chrobak, Youtao Z...
Microencapsulated electrophoretic displays (EPDs) are quickly emerging as an important technology for use in battery-powered portable computing devices. Thanks to bistability and ...
Michael A. Baker, Aviral Shrivastava, Karam S. Cha...
Semiconductor transient faults (i.e. soft errors) have become an increasingly important threat to microprocessor reliability. Simultaneous multithreaded (SMT) architectures exploi...
The phase-ordering problem is a long standing issue for compiler writers. Most optimizing compilers typically have numerous different code-improving phases, many of which can be a...
Prasad Kulkarni, David B. Whalley, Gary S. Tyson, ...