Sciweavers

1244 search results - page 185 / 249
» Software Quality and Productivity Improvement
Sort
View
LCTRTS
2007
Springer
16 years 9 days ago
SWL: a search-while-load demand paging scheme with NAND flash memory
As mobile phones become increasingly multifunctional, the number and size of applications installed in phones are rapidly increasing. Consequently, mobile phones require more hard...
Jihyun In, Ilhoon Shin, Hyojun Kim
ITC
1998
IEEE
174views Hardware» more  ITC 1998»
15 years 10 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
DATE
2008
IEEE
66views Hardware» more  DATE 2008»
16 years 19 days ago
Optimal Margin Computation for At-Speed Test
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
Jinjun Xiong, Vladimir Zolotov, Chandu Visweswaria...
FGCN
2008
IEEE
199views Communications» more  FGCN 2008»
16 years 19 days ago
A Context-Sensitive Rule-Based Architecture for a Smart Building Environment
In a smart building environment nomadic users can benefit from specialised contextsensitive services. These can increase productivity and offer an improved lifestyle for users. Th...
John Herbert, John O'Donoghue, Xiang Chen
DATE
2006
IEEE
96views Hardware» more  DATE 2006»
16 years 7 days ago
On the relation between simulation-based and SAT-based diagnosis
The problem of diagnosis – or locating the source of an error or fault – occurs in several areas of Computer Aided Design, such as dynamic verification, property checking, eq...
Görschwin Fey, Sean Safarpour, Andreas G. Ven...