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WSC
2001
15 years 8 months ago
Critical tools identification and characteristics curves construction in a wafer fabrication facility
The purpose of this research was to identify the factors in a wafer fabrication facility that significantly affect the cycle times of two main technologies that are currently in p...
Dima Nazzal, Mansooreh Mollaghasemi
EOR
2006
59views more  EOR 2006»
15 years 6 months ago
Sensitivity analysis in linear optimization: Invariant support set intervals
Sensitivity analysis is one of the most interesting and preoccupying areas in optimization. Many attempts are made to investigate the problem's behavior when the input data c...
Alireza Ghaffari Hadigheh, Tamás Terlaky
IWPC
2008
IEEE
16 years 1 months ago
Support for Understanding GUI Programs by Visualizing Execution Traces Synchronized with Screen Transitions
To support understanding a specific GUI functionality in a program, we propose a visualization technique that presents the correspondence between the screens before and after the...
Tatsuya Sato, Buntarou Shizuki, Jiro Tanaka
CCS
2007
ACM
16 years 24 days ago
Effect of static analysis tools on software security: preliminary investigation
Static analysis tools can handle large-scale software and find thousands of defects. But do they improve software security? We evaluate the effect of static analysis tool use on s...
Vadim Okun, William F. Guthrie, Romain Gaucher, Pa...
STEP
2005
IEEE
16 years 6 days ago
Software Process Improvement, Quality Assurance and Measurement
The article focuses on a problem software companies often face: the need to choose a software quality model that, besides being auditable, ensures the connection of quality goals ...
Jos J. M. Trienekens, Rob J. Kusters, Katalin Ball...