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ICCAD
2002
IEEE
161views Hardware» more  ICCAD 2002»
16 years 3 months ago
Non-tree routing for reliability and yield improvement
We propose to introduce redundant interconnects for manufacturing yield and reliability improvement. By introducing redundant interconnects, the potential for open faults is reduc...
Andrew B. Kahng, Bao Liu, Ion I. Mandoiu
HICSS
2008
IEEE
102views Biometrics» more  HICSS 2008»
16 years 27 days ago
Retrofitting Cyber Physical Systems for Survivability through External Coordination
Most Supervisory Control and Data Acquisition (SCADA) systems have been in operation for decades and they in general have 24x7 availability requirement, hence upgrading or adding ...
Kun Xiao, Shangping Ren, Kevin A. Kwiat
MTDT
2003
IEEE
100views Hardware» more  MTDT 2003»
15 years 11 months ago
Optimal Spare Utilization in Repairable and Reliable Memory Cores
Advances in System-on-Chip (SoC) technology rely on manufacturing and assembling high-performance system cores for many critical applications. Among these cores, memory occupies t...
Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-...
ICPP
2002
IEEE
15 years 11 months ago
ART: Robustness of Meshes and Tori for Parallel and Distributed Computation
In this paper, we formulate the array robustness theorems (ARTs) for efficient computation and communication on faulty arrays. No hardware redundancy is required and no assumptio...
Chi-Hsiang Yeh, Behrooz Parhami
DAC
2010
ACM
15 years 10 months ago
LUT-based FPGA technology mapping for reliability
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
Jason Cong, Kirill Minkovich