2498 search results - page 345 / 500 » Software Fault Tolerance |
177
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IOLTS
2000
IEEE
15 years 10 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
180
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ICCAD
2010
IEEE
15 years 4 months ago
2010
IEEE
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
150
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IPPS
2008
IEEE
16 years 26 days ago
2008
IEEE
We propose a new fault localization technique for software bugs in large-scale computing systems. Our technique always collects per-process function call traces of a target system...
188
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DMIN
2006
15 years 7 months ago
2006
Process monitoring refers to the task of detecting abnormal process operations resulting from the shift in the mean and/or the variance of one or more process variables. To success...
149
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ISCA
2005
IEEE
16 years 1 days ago
2005
IEEE
As chip densities and clock rates increase, processors are becoming more susceptible to transient faults that can affect program correctness. Up to now, system designers have prim...