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ISCA
2010
IEEE
199views Hardware» more  ISCA 2010»
15 years 10 months ago
Use ECP, not ECC, for hard failures in resistive memories
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
Stuart E. Schechter, Gabriel H. Loh, Karin Straus,...
VEE
2012
ACM
239views Virtualization» more  VEE 2012»
14 years 2 months ago
Facilitating inter-application interactions for OS-level virtualization
OS-level virtualization generates a minimal start-up and run-time overhead on the host OS and thus suits applications that require both good isolation and high efficiency. However...
Zhiyong Shan, Xin Wang 0001, Tzi-cker Chiueh, Xiao...
DATE
2006
IEEE
115views Hardware» more  DATE 2006»
16 years 15 days ago
Optimal periodic testing of intermittent faults in embedded pipelined processor applications
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
DSN
2006
IEEE
16 years 15 days ago
Assessment of the Effect of Memory Page Retirement on System RAS Against Hardware Faults
The Solaris 10 Operating System includes a number of new features for predictive self-healing. One such feature is the ability of the Fault Management software to diagnose memory ...
Dong Tang, Peter Carruthers, Zuheir Totari, Michae...
FOSSACS
2005
Springer
15 years 12 months ago
Fault Diagnosis Using Timed Automata
Fault diagnosis consists in observing behaviours of systems, and in detecting online whether an error has occurred or not. In the context of discrete event systems this problem has...
Patricia Bouyer, Fabrice Chevalier, Deepak D'Souza