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ICAC
2005
IEEE
16 years 4 days ago
Multi-resolution Abnormal Trace Detection Using Varied-length N-grams and Automata
Detection and diagnosis of faults in a large-scale distributed system is a formidable task. Interest in monitoring and using traces of user requests for fault detection has been o...
Guofei Jiang, Haifeng Chen, Cristian Ungureanu, Ke...
ISSTA
2004
ACM
15 years 12 months ago
Testing of java web services for robustness
This paper presents a new compile-time analysis that enables a testing methodology for white-box coverage testing of error recovery code (i.e., exception handlers) in Java web ser...
Chen Fu, Barbara G. Ryder, Ana Milanova, David Won...
DSN
2002
IEEE
15 years 11 months ago
Ditto Processor
Concentration of design effort for current single-chip Commercial-Off-The-Shelf (COTS) microprocessors has been directed towards performance. Reliability has not been the primary ...
Shih-Chang Lai, Shih-Lien Lu, Jih-Kwon Peir
ICST
2010
IEEE
15 years 5 months ago
Fault Detection Likelihood of Test Sequence Length
— Testing of graphical user interfaces is important due to its potential to reveal faults in operation and performance of the system under consideration. Most existing test appro...
Fevzi Belli, Michael Linschulte, Christof J. Budni...
ITC
2003
IEEE
119views Hardware» more  ITC 2003»
15 years 11 months ago
Fault Localization using Time Resolved Photon Emission and STIL Waveforms
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
Romain Desplats, Felix Beaudoin, Philippe Perdu, N...