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ATS
2009
IEEE
138views Hardware» more  ATS 2009»
16 years 1 months ago
Test Pattern Selection for Potentially Harmful Open Defects in Power Distribution Networks
Power distribution network (PDN) designs for today’s high performance integrated circuits (ICs) typically occupy a significant share of metal resources in the circuit, and henc...
Yubin Zhang, Lin Huang, Feng Yuan, Qiang Xu
HPDC
2006
IEEE
16 years 19 days ago
Toward Self Organizing Grids
— The potential of truly large scale grids can only be realized with grid architectures and deployment strategies that lower the need for human administrative intervention, and t...
Nael B. Abu-Ghazaleh, Michael J. Lewis
DAC
2004
ACM
16 years 16 hour ago
A new state assignment technique for testing and low power
In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feed...
Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J....
DAC
2003
ACM
15 years 12 months ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
DSN
2002
IEEE
15 years 11 months ago
Experimental Evaluation of Time-redundant Execution for a Brake-by-wire Application
This paper presents an experimental evaluation of a brake-by-wire application that tolerates transient faults by temporal error masking. A specially designed real-time kernel that...
Joakim Aidemark, Jonny Vinter, Peter Folkesson, Jo...