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DATE
2007
IEEE
155views Hardware» more  DATE 2007»
16 years 28 days ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
ICSM
2003
IEEE
15 years 12 months ago
Deriving tolerant grammars from a base-line grammar
A grammar-based approach to tool development in re- and reverse engineering promises precise structure awareness, but it is problematic in two respects. Firstly, it is a considera...
Steven Klusener, Ralf Lämmel
AOSD
2005
ACM
16 years 4 days ago
Distributing classes with woven concerns: an exploration of potential fault scenarios
Aspect-oriented programming (AOP) promises to benefit engineering by providing a layer of abstraction that can modularize system-level concerns. AOP is still a very young area of ...
Nathan McEachen, Roger T. Alexander
EH
2005
IEEE
127views Hardware» more  EH 2005»
16 years 6 days ago
On the Robustness Achievable with Stochastic Development Processes
Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant s...
Shivakumar Viswanathan, Jordan B. Pollack
EAAI
2010
144views more  EAAI 2010»
15 years 1 months ago
Fault diagnosis of industrial systems by conditional Gaussian network including a distance rejection criterion
The purpose of this article is to present a method for industrial process diagnosis with Bayesian network, and more particularly with Conditional Gaussian Network (CGN). The inter...
Sylvain Verron, Teodor Tiplica, Abdessamad Kobi