Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...
Margarida F. Jacome, Chen He, Gustavo de Veciana, ...
Continued advancements in fabrication technology and reductions in feature size create challenges in maintaining both manufacturing yield rates and long-term reliability of device...
Premkishore Shivakumar, Stephen W. Keckler, Charle...
We investigate the design of algorithms resilient to memory faults, i.e., algorithms that, despite the corruption of some memory values during their execution, are able to produce...
Conventional processor fault tolerance based on time/space redundancy is robust but prohibitively expensive for commodity processors. This paper explores an unconventional approac...
It is shown that the de Bruijn graph (dBG) can be used as an architecture for interconnection networks and a suitable structure for parallel computation. Recent works have classiï¬...