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ISSRE
2003
IEEE
16 years 21 days ago
Using a Log-normal Failure Rate Distribution for Worst Case Bound Reliability Prediction
Prior research has suggested that the failure rates of faults follow a log normal distribution. We propose a specific model where distributions close to a log normal arise natural...
Peter G. Bishop, Robin E. Bloomfield
STEP
2003
IEEE
16 years 21 days ago
Metamorphic Testing and Beyond
When testing a program, correctly executed test cases are seldom explored further, even though they may carry useful information. Metamorphic testing proposes to generate follow-u...
Tsong Yueh Chen, Fei-Ching Kuo, T. H. Tse, Zhiquan...
SWSTE
2003
IEEE
16 years 21 days ago
Towards a Standard Family of Languages for Matching Patterns in Source Code
This paper makes a case for the definition of a family of languages for expressing patterns over both the structure and semantics of source code. Our proposal is unique in that i...
Uri Dekel, Tal Cohen, Sara Porat
UIST
2003
ACM
16 years 20 days ago
VisionWand: interaction techniques for large displays using a passive wand tracked in 3D
A passive wand tracked in 3D using computer vision techniques is explored as a new input mechanism for interacting with large displays. We demonstrate a variety of interaction tec...
Xiang Cao, Ravin Balakrishnan
UIST
2003
ACM
16 years 20 days ago
Tactile interfaces for small touch screens
We present the design, implementation, and informal evaluation of tactile interfaces for small touch screens used in mobile devices. We embedded a tactile apparatus in a Sony PDA ...
Ivan Poupyrev, Shigeaki Maruyama
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