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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
16 years 1 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
ISCA
2009
IEEE
159views Hardware» more  ISCA 2009»
16 years 1 months ago
End-to-end register data-flow continuous self-test
While Moore’s Law predicts the ability of semi-conductor industry to engineer smaller and more efficient transistors and circuits, there are serious issues not contemplated in t...
Javier Carretero, Pedro Chaparro, Xavier Vera, Jau...
IWANN
2009
Springer
16 years 1 months ago
On the Bond Graphs in the Delaunay-Tetrahedra of the Simplicial Decomposition of Spatial Protein Structures
The examination of straightforwardly definable discrete structures in nucleic acids and proteins turned out to be perhaps the most important development in our present knowledge a...
Rafael Ördög, Vince Grolmusz
SEMWEB
2009
Springer
16 years 1 months ago
Results of GeRoMeSuite for OAEI 2009
GeRoMeSuite is a generic model management system which provides several functions for managing complex data models, such as schema integration, definition and execution of schema ...
Christoph Quix, Sandra Geisler, David Kensche, Xia...
SSS
2009
Springer
195views Control Systems» more  SSS 2009»
16 years 1 months ago
Anonymous Transactions in Computer Networks
Abstract. We present schemes for providing anonymous transactions while privacy and anonymity are preserved, providing user anonymous authentication in distributed networks such as...
Shlomi Dolev, Marina Kopeetsky
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