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ET
2002
97views more  ET 2002»
15 years 6 months ago
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer
MONET
1998
94views more  MONET 1998»
15 years 6 months ago
Hierarchically-Organized, Multihop Mobile Wireless Networks for Quality-of-Service Support
MMWN is a modular system of link- and network-layer algorithms that enables a multihop mobile wireless network to support distributed, real-time multimedia applications. In this pa...
Ram Ramanathan, Martha Steenstrup
TVLSI
2002
93views more  TVLSI 2002»
15 years 6 months ago
Simultaneous switching noise in on-chip CMOS power distribution networks
Simultaneous switching noise (SSN) has become an important issue in the design of the internal on-chip power distribution networks in current very large scale integration/ultra lar...
Kevin T. Tang, Eby G. Friedman
ICCAD
2008
IEEE
200views Hardware» more  ICCAD 2008»
15 years 5 days ago
Accurate Equivalent Energy Breakeven Time Estimation for Power Gating
Run-time Power Gating (RTPG) is a recent technique, which aims at aggressively reducing leakage power consumption. Energy breakeven time (EBT), or equivalent sleep time has been pr...
Hao Xu, Wen-Ben Jone, Ranga Vemuri
ASPDAC
2011
ACM
167views Hardware» more  ASPDAC 2011»
14 years 10 months ago
Variation-tolerant and self-repair design methodology for low temperature polycrystalline silicon liquid crystal and organic lig
- In low temperature polycrystalline silicon (LTPS) based display technologies, the electrical parameter variations in thin film transistors (TFTs) caused by random grain boundarie...
Chih-Hsiang Ho, Chao Lu, Debabrata Mohapatra, Kaus...