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146
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DATE
2010
IEEE
15 years 11 months ago
2010
IEEE
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
149
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DATE
2010
IEEE
15 years 10 months ago
2010
IEEE
Abstract--Leakage power consumption contributes significantly to the overall power dissipation for systems that are manufactured in advanced deep sub-micron technology. Different f...
170
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ASPDAC
2010
ACM
15 years 4 months ago
2010
ACM
The concept of having an integrated circuit (IC) generate its own unique digital signature has broad application in areas such as embedded systems security, and IP/IC counterpiracy...
155
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EXPERT
1998
15 years 5 months ago
1998
This article illustrates the complexities of real-world planning and how we can create AI planning systems to address them. We describe the IMACS Project (Interactive Manufacturab...