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166
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ECMDAFA
2009
Springer
16 years 1 months ago
2009
Springer
Abstract. Model-based development is supposed to improve the development efficiency by raising the abstraction level and generating applications instead of manually coding the appl...
171
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
— As the feature size of transistors gets smaller, fabricating them becomes challenging. Manufacturing process follows various corrective design-for-manufacturing (DFM) steps to ...
247
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MICRO
2008
IEEE
16 years 1 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
197
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ISQED
2007
IEEE
16 years 1 months ago
2007
IEEE
Clock distribution is one of the key limiting factors in any high speed, sub-100nm VLSI design. Unwanted clock skews, caused by variation effects like manufacturing variations, po...
209
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SP
2007
IEEE
16 years 1 months ago
2007
IEEE
Hardware manufacturers are increasingly outsourcing their IC fabrication work overseas due to much lower costs. This poses a significant security risk for ICs used for critical m...