This paper presents a service marketplace vision for enterprise-wide integrated design modeling. In this environment, expert participants and product development organizations are...
Shaun Abrahamson, David Wallace, Nicola Senin, Pet...
Reports of NAND flash device testing in the literature have for the most part been limited to examination of circuit-level parameters on raw flash chips or prototypes, and syste...
- Many research questions remain open with regard to improving reliability in exascale systems. Among others, statistics-based analysis has been used to find anomalies, to isolate ...
Line C. Pouchard, Jonathan D. Dobson, Stephen W. P...
Multicore architectures, which have multiple processing units on a single chip, have been adopted by most chip manufacturers. Most such chips contain on-chip caches that are share...
The problem of failure diagnosis has received a considerable attention in the domain of reliability engineering, process control and computer science. The increasing stringent req...