12032 search results - page 365 / 2407 » Simulation of Manufacturing Systems |
158
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ASPDAC
2007
ACM
15 years 10 months ago
2007
ACM
- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
194
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DAC
2010
ACM
15 years 10 months ago
2010
ACM
The identification of speedpaths is required for post-silicon (PS) timing validation, and it is currently becoming timeconsuming due to manufacturing variations. In this paper we...
188
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DFT
2004
IEEE
15 years 10 months ago
2004
IEEE
Defect tolerance is an extremely important aspect in nano-scale electronics as the bottom-up selfassembly fabrication process results in a significantly higher defect density comp...
210
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ASPDAC
2008
ACM
15 years 8 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
135
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ASPDAC
2005
ACM
15 years 8 months ago
2005
ACM
- By putting different chips on the same mask, shuttle mask (or multiple project wafer) provides an economical solution for low volume designs and design prototypes to share the ri...