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177
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VTS
2008
IEEE
16 years 1 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
160
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ETS
2006
IEEE
16 years 26 days ago
2006
IEEE
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faul...
232
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IROS
2006
IEEE
16 years 25 days ago
2006
IEEE
Abstract— This paper presents a novel application of modular robotic technology. Many researchers expect manufacturing technology will allow robot modules to be built at smaller ...
176
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IROS
2006
IEEE
16 years 25 days ago
2006
IEEE
— A “Discretely Actuated Robotic Manipulator”, or “D-ARM”, is any member of a class of robotic manipulators powered by actuators that have only discrete positional stable...
143
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CAIP
2005
Springer
16 years 11 days ago
2005
Springer
Abstract. This paper presents a color filter array (CFA) image indexing approach. To enhance the functionality of single-sensor consumer electronics such as digital cameras, imagi...