5236 search results - page 889 / 1048 » Similarity Measurement in Context |
213
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IV
2003
IEEE
15 years 11 months ago
2003
IEEE
An alternative term for these diagrams is “Euler-Venn diagrams” but they are often inaccurately called “Venn diagrams”. Venn diagrams often look similar, but must contain a...
162
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ILP
2003
Springer
15 years 11 months ago
2003
Springer
In the case of concept learning from positive and negative examples, it is rarely possible to find a unique discriminating conjunctive rule; in most cases, a disjunctive descripti...
155
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IEEEINTERACT
2002
IEEE
15 years 11 months ago
2002
IEEE
Smaller input data sets such as the test and the train input sets are commonly used in simulation to estimate the impact of architecture/micro-architecture features on the perform...
191
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CVPR
2010
IEEE
15 years 11 months ago
2010
IEEE
In this paper, a new scheme to address the face recognition problem is proposed. Different from traditional face recognition approaches which represent each facial image by a sing...
185
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SIGMETRICS
2010
ACM
15 years 11 months ago
2010
ACM
This paper addresses the problem of determining the node locations in ad-hoc sensor networks when only connectivity information is available. In previous work, we showed that the ...