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HIPEAC
2010
Springer
16 years 3 months ago
Maestro: Orchestrating Lifetime Reliability in Chip Multiprocessors
As CMOS feature sizes venture deep into the nanometer regime, wearout mechanisms including negative-bias temperature instability and timedependent dielectric breakdown can severely...
Shuguang Feng, Shantanu Gupta, Amin Ansari, Scott ...
ICCD
2008
IEEE
202views Hardware» more  ICCD 2008»
16 years 3 months ago
CrashTest: A fast high-fidelity FPGA-based resiliency analysis framework
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
Andrea Pellegrini, Kypros Constantinides, Dan Zhan...
SAC
2010
ACM
16 years 1 months ago
Implementing software product lines using traits
A software product line (SPL) is a set of software systems with well-defined commonalities and variabilities that are developed by managed reuse of common artifacts. In this pape...
Lorenzo Bettini, Ferruccio Damiani, Ina Schaefer
IEEEARES
2009
IEEE
16 years 1 months ago
Defeating Dynamic Data Kernel Rootkit Attacks via VMM-Based Guest-Transparent Monitoring
—Targeting the operating system kernel, the core of trust in a system, kernel rootkits are able to compromise the entire system, placing it under malicious control, while eluding...
Junghwan Rhee, Ryan Riley, Dongyan Xu, Xuxian Jian...
ICS
2009
Tsinghua U.
16 years 1 months ago
/scratch as a cache: rethinking HPC center scratch storage
To sustain emerging data-intensive scientific applications, High Performance Computing (HPC) centers invest a notable fraction of their operating budget on a specialized fast sto...
Henry M. Monti, Ali Raza Butt, Sudharshan S. Vazhk...
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