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ITC
1996
IEEE
114views Hardware» more  ITC 1996»
15 years 11 months ago
A Demonstration IC for the P1149.4 Mixed-Signal Test Standard
The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
Keith Lofstrom
HCI
2007
15 years 8 months ago
On Some Aspects of Improving Mobile Applications for the Elderly
Improving the quality of life of elderly people is an emerging issue within our information society for both research and development. This paper addresses some issues on the devel...
Andreas Holzinger, Gig Searle, Alexander K. Nische...
ICCAD
2003
IEEE
98views Hardware» more  ICCAD 2003»
16 years 3 months ago
Achieving Design Closure Through Delay Relaxation Parameter
Current design automation methodologies are becoming incapable of achieving design closure especially in the presence of deep submicron effects. This paper addresses the issue of ...
Ankur Srivastava, Seda Ogrenci Memik, Bo-Kyung Cho...
CHI
2006
ACM
16 years 7 months ago
Dispelling "design" as the black art of CHI
We discuss the legacy and processes of creative design, and differentiate it from the type of user-centered design commonly found in CHI. We provide an example of this process, an...
Tracee Vetting Wolf, Jennifer Ann Rode, Jeremy B. ...
DELTA
2002
IEEE
15 years 11 months ago
Teaching Integrated Circuit and Semiconductor Device Design in New Zealand: The University of Canterbury Approach
Teaching the practical aspects of device and chip design in New Zealand presents many problems, including high manufacturing costs, long lead times, and the lack of local industry...
Richard J. Blaikie, Maan M. Alkaisi, Steven M. Dur...