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ISVLSI
2008
IEEE
136views VLSI» more  ISVLSI 2008»
16 years 1 months ago
A Real Case of Significant Scan Test Cost Reduction
With the advent of nanometer technologies, the design size of integrated circuits is getting larger and the operation speed is getting faster. As a consequence, test cost is becom...
Selina Sha, Bruce Swanson
NOMS
2008
IEEE
16 years 29 days ago
PathCrawler: Automatic harvesting web infra-structure
Abstract—As network topologies have grown in size and complexity, it is becoming a daunting task for network administrators to keep track the capacity dimensioning of newly insta...
Cesar Marcondes, M. Y. Sanadidi, Mario Gerla, Ramo...
SEAA
2008
IEEE
16 years 29 days ago
Defect Prediction using Combined Product and Project Metrics - A Case Study from the Open Source "Apache" MyFaces Project Family
The quality evaluation of open source software (OSS) products, e.g., defect estimation and prediction approaches of individual releases, gains importance with increasing OSS adopt...
Dindin Wahyudin, Alexander Schatten, Dietmar Winkl...
SECON
2008
IEEE
16 years 29 days ago
Breath: A Self-Adapting Protocol for Wireless Sensor Networks in Control and Automation
—The novel cross-layer protocol Breath for wireless sensor networks is designed, implemented, and experimentally evaluated. The Breath protocol is based on randomized routing, MA...
Pan Gun Park, Carlo Fischione, Alvise Bonivento, K...
SECON
2008
IEEE
16 years 29 days ago
Deploying Directional Sensor Networks with Guaranteed Connectivity and Coverage
Abstract—In contrast to existing work on the connected coverage problem in wireless sensor networks which assumes omnidirectional sensors with disk-like sensing range, this paper...
Xiaofeng Han, Xiang Cao, Errol L. Lloyd, Chien-Chu...
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