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ICCAD
2006
IEEE
95views Hardware» more  ICCAD 2006»
16 years 3 months ago
Robust estimation of parametric yield under limited descriptions of uncertainty
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
Wei-Shen Wang, Michael Orshansky
172
Voted
IUI
2009
ACM
16 years 3 months ago
An interface for targeted collection of common sense knowledge using a mixture model
We present a game-based interface for acquiring common sense knowledge. In addition to being interactive and entertaining, our interface guides the knowledge acquisition process t...
Robert Speer, Jayant Krishnamurthy, Catherine Hava...
CVPR
2010
IEEE
16 years 2 months ago
3D Shape Scanning with a Time-of-Flight Camera
We describe a method for 3D object scanning by aligning depth scans that were taken from around an object with a time-of-flight camera. These ToF cameras can measure depth scans ...
Christian Theobalt, Yan Cui, Sebastian Schuon, Seb...
SAC
2010
ACM
16 years 1 months ago
Dual analysis for proving safety and finding bugs
Program bugs remain a major challenge for software developers and various tools have been proposed to help with their localization and elimination. Most present-day tools are base...
Corneliu Popeea, Wei-Ngan Chin
DATE
2009
IEEE
125views Hardware» more  DATE 2009»
16 years 1 months ago
HLS-l: High-level synthesis of high performance latch-based circuits
An inherent performance gap between custom designs and ASICs is one of the reasons why many designers still start their designs from register transfer level (RTL) description rath...
Seungwhun Paik, Insup Shin, Youngsoo Shin
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